• Ph.D, Indian Institute of Science, Bangalore
• M.Tech (Quality, Reliability and Operations Research), Indian Statistical Institute, Calcutta

Awards

• Prof. U. S. Nair Best Paper Presentation Award in International Conference on "Statistics for Twenty-First Century" organized by Department of Statistics, University of Kerala, Trivandrum, India during Dec 17-th to 19-th, 2015
• Support from International Statistical Institute for the IISA Chennai Conference and R-workshop participation
• Ranked Second in M.Tech (QROR).
• Received National Scholarship at the Secondary Stage for Talented Children in Rural Areas

Conferences, Seminars & Talks

• Roy, S. (2018). "Bayesian Accelerated Life Test Plans under Competing Dependent Causes of Failure." XXII Annual International Society of Operations Management Conference, held during Dec 20-th to 22-nd, 2018, at Indian Institute of Management Kozhikode, Kozhikode, India.
• Roy, S. (2017). "Bayesian c-optimal progressive type-I interval censoring schemes for Weibull system lifetimes." XXI Annual International Society of Operations Management Conference, held during Dec 21-st to 23-rd, 2017, at Ahmedabad University, Ahmedabad, India.
• Roy, S. and Pradhan, B. (2016). "Bayesian D-optimal Progressive Type-I Interval Censoring Schemes." XX Annual International Society of Operations Management Conference, held during Dec 22-nd to 24-th, 2016, at ABV-Indian Institute of Information Technology and Management, Gwalior, India.
• Roy, S. (2015). "Inference and Optimum Life Testing Plans for Lognormal Distribution under Progressive Type-I Interval Censoring." International Indian Statistical Association Conference, held during Dec 20-th to 24-th, 2015, Pune, India.
• Roy, S. (2015). "Accelerated Life Testing of Two-component Series Systems with Dependent Causes of Failure." International Conference on Statistics for Twenty-First Century, held during Dec 17-th to 19-th, 2015, organized by Department of Statistics, University of Kerala, Trivandrum, India.
• Roy, S. (2015). "Bayesian Accelerated Life Test Plans for Series Systems under Competing Weibull Causes of Failure." XIX Annual International Society of Operations Management Conference, held during Dec 11-th to 13-th, 2015, at Indian Institute of Management Calcutta, Kolkata, India.
• Roy, S. (2015). "Accelerated Life Testing and Related Topics." Invited Lecture in CEP Course on “Environmental Evaluation Techniques” in DRDO, held during 2-6 Feb, Bangalore, India.
• Roy, S. (2015). "Bayesian Accelerated Life Testing under Competing Log-location-scale Family of Causes of Failure." Research Scholars’ Meet on Reliability Theory, Survival Analysis and Related Topics, January 22nd to 23rd, organized by SQC & OR Unit, Indian Statistical Institute, Kolkata, India.
• Roy, S. and Mukhopadhyay, C. (2014). "MCMC for Bayesian analysis of accelerated life testing data of series systems." Eleventh International Conference on Monte Carlo and Quasi-Monte Carlo Methods in Scientific Computing, MCQMC2014, April 6 – 11, KU Leuven, Belgium.
• Roy, S. and Mukhopadhyay, C. (2013). "Bayesian Accelerated Life Testing of Series Systems." Research Scholars’ Meet on Reliability Theory, Survival Analysis and Related Topics, February 26-th to 28-th, organized by SQC & OR Unit, Indian Statistical Institute, Kolkata, India.
• Roy, S. and Mukhopadhyay, C. (2013). "Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure." nternational Indian Statistical Association Conference: Statistics, Science, and Society: New Challenges and Opportunities, January 2-nd to 5-th, Chennai, India.
• Roy, S. (2012). "Accelerated Life Testing." CEP Course on Trends in Environmental Engineering Evaluation and Practices, organized by Electronics & Radar Development Establishment, Defence Research and Development Organization, September 24-th to 28-th, Bangalore, India.
• Roy, S. and Mukhopadhyay, C. (2012). "Accelerated Life Testing of Series Systems." Joint Meeting of y-BIS- International Young Business and Industrial Statisticians and jSPE- Young Portuguese Statisticians, held during July 23-rd to 26-th, at Universidade Nova de Lisboa, Lisbon, Portugal.
• Roy, S. and Mukhopadhyay, C. (2011). "Bayesian Accelerated Life Testing of Series Systems." International Conference on Advances in Probability and Statistics - Theory and Applications: A Celebration of N. Balakrishnan’s 30 years of Contributions to Statistics, December 28-th to 31-st, The Chinese University of Hong Kong, Hong Kong, SAR, China.
• Roy, S. and Mukhopadhyay, C. (2011). "Bayesian Accelerated Life Testing Under Competing Exponential Causes of Failure." International Conference on Quality & Reliability Engineering, December 20-th to 22-nd, 2011, organized by SQC & OR Unit, Indian Statistical Institute, Bangalore Centre, India.
• Chakraborty, A.K. and Ghosh, S. and Roy, S. (2011). "Determining Optimum Software Release Time with Euler Distribution as Prior for the Number of Undiscovered Bugs." International Conference on Quality & Reliability Engineering, December 20-th to 22-nd, organized by SQC & OR Unit, Indian Statistical Institute, Bangalore Centre, India.
• Roy, S. (2010). "Lifetime Data Analysis." CEP Course on Environmental Engineering, organized by Electronics & Radar Development Establishment, Defence Research and Development Organization,November 8-th to 12-th, Bangalore, India.
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Research Areas

• Frequentist & Bayesian Statistical Inference
• Reliability & Survival Analysis
• Bayesian Experimental Design
• Statistical Computing

Significant Publications

• Chakrabarty, J. B., Chowdhury, S. and Roy, S (2019). Optimum Life Test Plan for Type-I Hybrid Censored Weibull Distributed Products sold under General Rebate Warranty. Forthcoming in International Journal of Production Research.
• Roy, S. and Pradhan, B. (2019). Bayesian C-optimal Life Testing Plans under Progressive Type-I Interval Censoring Scheme. Applied Mathematical Modelling. 70:299-314
• Roy, S. (2018). Bayesian Accelerated Life Test Plans for Series Systems with Weibull Component Lifetimes. Applied Mathematical Modelling. 62: 383-403.
• Roy, S. and Pradhan, B. (2017). Bayesian optimum life testing plans under progressive Type-I interval censoring scheme. Quality and Reliability Engineering International. 33:2727-2737.
• Roy, S., Pradhan, B. and Gijo, E. V. (2017). Estimation of P (X < Y ) for generalized half logistic distribution based on Type-II censored data. International Journal of Quality & Reliability Management. 34:1111-1122.
• Roy, S., Gijo, E. V. and Pradhan, B. (2017). Inference based on progressive Type-I interval censored data from log-normal distribution. Communications in Statistics - Simulation and Computation. 46:6495–6512
• Roy, S. and Mukhopadhyay, C. (2016). Bayesian D-Optimal ALT Plans for Series Systems with Competing Exponential Causes of Failure. Journal of Applied Statistics. 43:1–17.
• Mukhopadhyay, C. and Roy, S. (2016). Bayesian Accelerated Life Testing under Competing Log-Location-Scale Family of Causes of Failure. Computational Statistics. 31: 89-119
• Roy, S. and Mukhopadhyay, C. (2015). Maximum Likelihood Analysis of Multi-Stress ALT Data of Series Systems with Competing Log-Normal Causes of Failure. Journal of Risk and Reliability, 229:119–130.
• Roy, S. and Mukhopadhyay, C. (2014). Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure. Communications in Statistics - Theory and Methods 43:2429–2451
• Pradhan, B., Roy, S. and Anis, M.J. (2014). Inference for the Component and System Lifetime Distribution of a k-unit parallel system based on system data. Communications in Statistics - Simulation and Computation, 43, 45-61.
• Bandyopadhayay, A., Roy, S. and Ghosh, D. (2013). Forecasting Day- Ahead Price of Electricity- A Dynamic Regression Approach. International Journal of Business Excellence, 6, 584-604.
• Roy, S. and Mukhopadhyay, C. (2013). Bayesian Accelerated Life Testing under Competing Exponential Causes of Failure. In B. John, U.H. Acharya, A. K. Chakraborty (Eds.), Quality and Reliability Engineering-Recent Trends and Future Directions (pp. 229-245). Allied Publishers.
• Ghosh, S., Roy, S. and Chakraborty, A.K. (2013). Determining Optimum Software Release Time with Euler Distribution as Prior for the Number of Undis- covered Bugs. In B. John, U.H. Acharya, A. K. Chakraborty (Eds.), Quality and Reliability Engineering-Recent Trends and Future Directions (pp. 302-312). Allied Publishers.

Teaching

• PGP 106: Quantitative Methods
• PG2QM-019: Data Analytics using R
• FPM 8: Linear Algebra and Linear Optimization
• FPM 26: Statistical Learning with R
• FPM 27: Statistical Inference with R
• FPM 49: Industrial Statistics and Advanced Quality Control
• Faculty Development Program (FDP): Multivariate Data Analysis